UMC Debuts 45nm SRAM Test Chips
November 24, 2006
On November 20, Taiwanese UMC announced that it has successfully launched SRAM (Static Random Access Memory) test chips which incorporate 45nm technology. The company stated that these chips, with 30% better performance than 65nm chips, will begin trial run in the second half of 2007. The R&D development for the 45nm chip is based in UMC's fab 12A, located in the Tainan Science Park. Asides UMC, TSMC and Chartered also possess 45nm process development capabilities.